Video: Interface Characterization in Battery Research

Dr. Anja Henss from the Justus-Liebig-University Giessen focuses on the detailed interfacial analysis of materials used in energy conversion and storage. She is interested in studying the intricate surface and interfacial properties of materials using time-of-flight secondary ion mass spectrometry (ToF-SIMS), X-ray photoelectron spectroscopy (#XPS) and focused ion beam secondary electron microscopy (FIB-SEM), and performing extensive stability testing to gain a deeper understanding of the interfacial properties involved.